The diagnostic can be configured to execute in one of two modes, presence test mode or verification mode. Most devices are manufactured in several temperature grades.The diagnostic checks for brand identification, verifies the processor operating frequency, tests specific processor features and performs a stress test on the processor. The use of such grades ensures that a device is suitable for its application, and will withstand the environmental conditions in which it is used.įor example, Maxim Integrated uses five temperature grades for its products: Nevertheless, each manufacturer defines its own temperature grades so designers must pay close attention to actual datasheet specifications.

Normal operating temperature ranges are affected by several factors, such as the power dissipation of the device. These factors are used to define a 'threshold temperature' of a device, i.e. its maximum normal operating temperature, and a maximum operating temperature beyond which the device will no longer function. Between these two temperatures, the device will operate at a non-peak level. For instance, a resistor may have a threshold temperature of 70 ☌ and a maximum temperature of 155 ☌, between which it exhibits a thermal derating. The junction temperature is affected by the ambient temperature, and for integrated circuits, is given by the equation: T J = T a + P D × R j a įor electrical devices, the operating temperature may be the junction temperature (T J) of the semiconductor in the device. In which T J is the junction temperature in ☌, T a is the ambient temperature in ☌, P D is the power dissipation of the integrated circuit in W, and R ja is the junction to ambient thermal resistance in ☌/W.Įlectrical and mechanical devices used in military and aerospace applications may need to endure greater environmental variability, including temperature range. In the United States Department of Defense has defined the United States Military Standard for all products used by the United States Armed Forces. A product's environmental design and test limits to the conditions that it will undergo throughout its service life are specified in MIL-STD-810, the Department of Defense Test Method Standard for Environmental Engineering Considerations and Laboratory Tests.

Intel processor diagnostic tool